Main -> Products -> Si Detectors & Spectrometers -> XRF Analyzer X-Art M

ED XRF Analyzer X-Art M*

APPLICATION

X-Art M is a versatile analyzer for determination of chemical composition in various objects including artworks. In the open air elements from Mg (Z=12) to U (Z=92) are analyzed simultaneously. Detection limit for the elements of moderate atomic number in light matrix is about 1 ppm. Detector crystal thickness of 3 to 5 mm provides high efficiency and in principle all heavy elements can be analyzed through K-series fluorescent lines.

FEATURES

on-line non-destructive qualitative and quantitative analysis of material composition directly at the object surface,
arbitrary position of the analytical part in the space,
small distance from the sample surface to the detector window which provides effective analysis of light elements,
simple and convenient operation and service.

Optional:

sample-to-detector air gap filled with Helium atmosphere to enhance the intensity of light element lines in the spectra detected,
precize positioning system to change the distance between the sample surface and analytical unit for separate layer by layer spectra detection from sandwich-type objects (XRF Tomography - PDF).

SPECIFICATIONS

Parameter	Value
Locality of analysis	The spot at the object of 0.1 to 12 mm size
Excitation source	X-ray tube, Ag or Rh anode, HV 4 to 50 kV, anode current up to 1 mA
X-ray filtration	A set of changeable filters to optimize excitation of certain elements
Collimation	Changeable diaphragms of different diameters to analyze small sample areas
Detector type	Peltier cooled Si(Li) detector
Analytical part weight	12 kg
Interface	Software compatible with PC or Notebook
Power supply	220/110 V, 50/60 Hz or 12 V (optional)
Total power consumption	140 W

For additional information, please contact us: alexs@comita.ru.

* Produced in cooperation with JSC Comita, St.Petersburg, Russia

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